Wireless Communication Solutions
Intellectual Property, Test Products and R&D Services
ZigBee Automated Manufacturing Test Solution
The ZigBee Manufacturing test solution takes not more than 2-3 seconds to perform all the RF tests, which includes various Transmitter and Receiver tests and giving out detailed tests reports. The solution is capable of testing multiple DUTs in parallel.
“Our partnership with SeaSolve to develop a manufacturing test solution for testing of Ember’s ZigBee chips enables our clients to start up manufacturing in a matter of days while also achieving the lowest cost of test at the highest coverage” said John Loukota, Ember’s Director of Hardware Engineering
Watch this demo to learn about SeaSolve’s ZigBee test solution. See how you can test in just 2-3 seconds with SeaSolve’s ZigBee Test Solution.
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The test system can be scaled based on the requirements i.e. it could be used as a production tester (both high and low volumes) as well as design validation platform. |
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Include firmware integration and flash programming |
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PCB and RF testing (transmitter and receiver) |
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Use parallel process model that helps in optimizing the resources and testing of multiple UUTs thus increasing the throughput and reducing the cost. |
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Sequencing of tests as per the requirement |
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Setting of privileges for Administrator and operators |
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Include APIs that result in faster test times |
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Include option to add calibration factor and loss compensation |
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Provides database connectivity that help in tracking and storing the results |
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Seamlessly integrates with PXI instruments and interacts with UUT (firmware) via various interfaces like USB, serial port and LAN |
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Script Editor to configure system parameters, test parameters like test limits etc |
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Support for leading 802.15.4 chipsets |
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Additional features include MAC programming, support for Scanners etc |
PCBA Tests
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Voltage & Current Testing |
RF Tests (Transmitter Tests)
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Transmit Power |
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PSD (Power Spectral Density ) Mask |
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CFO ( Center Frequency Tolerance) |
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EVM ( Error Vector Magnitude) |
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Carrier Suppression |
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Ramp Up / Down |
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Phase Noise |
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Phase Lock Loop (PLL) Convergence |
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Tx / Rx Turnaround Time |
RF Tests (Receiver Tests)
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Receiver Sensitivity |
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Receiver Maximum Input Power |
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Receiver Adjacent Channel Rejection |
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Receiver Alternate Channel Rejection |
ZigBee Resource
